Automated Controller Hardware-In-The-Loop Testbed for EV Charger Resilience Analysis

被引：0
|
作者：
Starke, Michael [1 ]
Kim, Namwon [1 ]
Dean, Benjamin [1 ]
Campbell, Steven [1 ]
Chinthavali, Madhu [1 ]
机构：
[1] Oak Ridge Natl Lab, Grid Syst Architecture Elect & Energy Infrastruct, Oak Ridge, TN 37830 USA
来源：
2023 IEEE TRANSPORTATION ELECTRIFICATION CONFERENCE & EXPO, ITEC | 2023年
关键词：
automation; data analytics; electric vehicles; EV charging; resilience; RELIABILITY;
D O I：
10.1109/ITEC55900.2023.10186993
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper focuses on the development of a tool that includes an automated testbed with controls, protection, and communications integrated into a real-time system to provide a platform to generate data sets for failure modes and effects analysis. This tool establishes a value for automation of data generation for different scenarios and addresses the gap of nonexistent field data for different applications and use cases. The features of this tool can further be expanded to include multiple power electronics models, communication protocols, and scaled system architectures. This general framework was evaluated for a DC fast charger system use case to provide quantitative solution for resiliency.
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页数：6
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