Optimizing Post-Silicon Validation for FPGA Serial Configuration using an Automation Framework and Timing Characterization Verification

被引:0
|
作者
Zainol, Mohd Amiruddin [1 ]
Khamron, Sompon [1 ]
Bin, Ng Gua [1 ]
机构
[1] Intel Microelect M Sdn Bhd, Bayan Lepas, Pulau Pinang, Malaysia
关键词
post-silicon; verification; validation; timing characterization; serial configuration; QSPI; FPGA;
D O I
10.1109/ITC-Asia58802.2023.10301165
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The increasing complexity of integrated circuit designs necessitates a more accurate and effective method for post-silicon validation and verification of serial configuration. This paper introduces an approach for post-silicon validation and verification of active serial configuration on Intel FPGA devices, focusing on the Agilex family. Our innovative method concentrates on leveraging an automation framework that enhances the accuracy and efficiency of the validation process by incorporating a combination of implemented test case scenarios and continuous automated regression tests. To guarantee the device operates according to specifications during the verification process, we propose a cutting-edge characterization method utilizing FPGA technology and QSPI flash, overcoming traditional limitations in electrical validation methods. In addition, the proposed method features reusable hardware and software implementations. By demonstrating the effectiveness of our approach across various operating conditions, we not only enhance confidence in the Agilex datasheet but also pave the way for more efficient and accurate post-silicon validation processes in FPGA design and development. Furthermore, this not only enhances the reliability of the post-silicon validation process but also improves overall product quality.
引用
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页数:6
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