Double Electron Capture Probability at He2+ Ion Xe Atom Collisions with Different Impact Parameters

被引：0
|
作者：
Basalaev, A. A. [1 ]
Panov, M. N. [1 ]
Smirnov, O. V. [1 ]
机构：
[1] Ioffe Inst, St Petersburg, Russia
来源：
TECHNICAL PHYSICS LETTERS | 2023年 / 49卷 / 12期
关键词：
double electron capture; capture with ionization; scattering differential cross section; impact parameter;
D O I：
10.1134/S1063785023900066
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Differential cross sections for scattering of helium atoms formed at collisions of He2+ ions with kinetic energies of 1.97, 3.00, and 7.17 keV/a.m.u with Xe atoms in processes with the formation of slow xenon ions with charges 2-4 have been measured. The projectiles deflection function is calculated. The probability of all these processes occurring at various values of the impact parameter of colliding particles is determined. The role of the electron shells of the Xe atom 5(s, p) and 4(s, p, d) for the capture of two electrons is determined depending on the speed of approach of the colliding particles, the impact parameter and the charge of the formed xenon ions.
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收藏
页码：212 / 215
页数：4
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