Dynamics of Topological Defects in a Tunnel-Diode Oscillator Lattice Loop

This study investigates the dynamical behavior of topological defects in a tunnel-diode oscillator lattice loop. Bifurcation analyses were first developed to show that bias voltages exist, where the lattice loop allows no sink-source pair solution. In such voltages initially set sink-source pair annihilates to become a topological defect with a dislocation form of the background rotary pulses. The topological defect moves to the opposite direction as the rotary pulse. Interestingly, the former synchronizes sub-harmonically with the latter. Thus, the defect was detected using a time-domain coherent measurement of a test lattice loop fabricated on a breadboard. This paper reports the results of bifurcation analyses and measurements.