The Impact of the Connection Failure of Ground Solder Balls on Digital Signal Waveform

被引:2
|
作者
Song, Kaixuan [1 ,2 ]
Gao, Jinchun [1 ,2 ]
Flowers, George T. [3 ,4 ]
Wang, Ziren [5 ]
Wang, Chaoyi [1 ,2 ]
Yi, Wei [6 ]
Cheng, Zhongyang
机构
[1] Beijing Univ Posts & Telecommun, Sch Elect Engn, Beijing, Peoples R China
[2] Beijing Univ Posts & Telecommun, Beijing Key Lab Work Safety Intelligent Monitoring, Beijing 100876, Peoples R China
[3] Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA
[4] Auburn Univ, Ctr Adv Vehicle & Extreme Environm Elect, Auburn, AL 36849 USA
[5] China Acad Informat & Commun Technol, China Telecommun Technol Labs, Beijing 100045, Peoples R China
[6] Auburn Univ, Mat Res & Educ Ctr, Auburn, AL 36849 USA
关键词
Ball-grid arrays (BGAs); connection failure; digital signal waveform; equivalent circuit model; transmission loss; BGA; RELIABILITY; INTERCONNECTION; INTEGRITY; PACKAGES;
D O I
10.1109/TEMC.2022.3221164
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ball-grid array (BGA) packages are widely used in digital signal devices, whose reliability and signal integrity are critical. In this research, the impact of failed ground solder balls on digital signal waveforms was theoretically modeled and analyzed, and the results were experimentally verified. A 3-D electromagnetic field model of a digital signal transmission channel with failed ground solder balls was developed to analyze the signal transmission in the frequency domain. In addition, a time-domain waveform simulation system was developed to examine the changes in the digital signal waveforms before and after degradation. Based on the structural and signal transmission characteristics of the solder area with failed ground solder balls, an equivalent circuit model of the degraded solder area was developed, which accurately predicts the effect of the failed ground solder balls on the amplitude and rising edge of the digital signals. The results obtained from the simulation were validated using experimental tests. This study fully examines the effects of the location and number of failed ground solder ball on signal transmission in both the frequency and the time domain. It provides insight and guidance regarding the impact on signal integrity of such faults, which serves to assist in improved packaging reliability and the development of fault detection strategies for such electronic systems.
引用
收藏
页码:312 / 322
页数:11
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