Least squares estimators for reflected Ornstein-Uhlenbeck processes

被引:1
|
作者
Han, Yuecaia [1 ]
Zhang, Dingwen [1 ,2 ]
机构
[1] Jilin Univ, Sch Math, Changchun, Peoples R China
[2] Jilin Univ, Sch Math, Changchun 130012, Peoples R China
关键词
Least squares estimator; reflected Ornstein-Uhlenbeck process; ergodicity; continuously observed processes; discretely observed processes; MAXIMUM-LIKELIHOOD-ESTIMATION; DENSITIES;
D O I
10.1080/03610926.2023.2273204
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
In this article, we investigate the parameter estimation problem for reflected Ornstein-Uhlenbeck processes with mean reversion. Both estimates based on either continuously or discretely observed processes are considered. The explicit formulas for the estimators are derived using the least squares method. Under regular conditions, we obtain the strong consistency and establish the asymptotic normality for the estimators. Simulation results demonstrate that the performance of our proposed estimators for the drift parameters is superior to the moment estimators. The currency exchange rate data is used to illustrate the theoretical results.
引用
收藏
页码:7746 / 7759
页数:14
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