Thermoelectric, Magnetic Properties and Re-entrant Spin-glass State in MBE Grown FeAs Film on LaAlO3(100) Substrate

被引:1
|
作者
Thiet, Duong Van [1 ]
Dung, Dang Duc [2 ]
Nguyen, Van Quang [3 ]
Duong, Anh Tuan [4 ]
Chung, Nguyen Xuan [5 ]
Hong, Nguyen Tuan [1 ]
Cho, Sunglae [6 ]
机构
[1] Vietnam Acad Sci & Technol, Ctr High Technol Dev, Hoang Quoc Viet 18, Hanoi 100000, Vietnam
[2] Hanoi Univ Sci & Technol, Sch Engn Phys, Dai Co Viet 1, Hanoi 100000, Vietnam
[3] Korea Atom Energy Res Inst KAERI, Neutron Sci Div, Daejeon 34057, South Korea
[4] Phenikaa Univ, Fac Mat Sci & Engn, Yen Nghia, Hanoi, Vietnam
[5] Hanoi Univ Min & Geol, Dept Phys, Pho Vien 18, Hanoi 100000, Vietnam
[6] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
基金
新加坡国家研究基金会;
关键词
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I
10.1149/2162-8777/acb96c
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the growth, thermoelectric, magnetic properties, and re-entrant spin-glass state in MnP-type orthorhombic FeAs thin film, grown on LaAlO3 (100) substrate by using a molecular beam epitaxy. The film is polycrystalline with a grain size about 200 nm. Electrical resistivity as a function of temperature revealed a metallic behavior. A sign change of Seebeck coefficient was observed at 370 K, due to the contribution of multiple bands to charge transport. We found a re-entrant spin-glass state in the film, attributed to strain in the sample. As a result, a very sharp spin-glass magnetic transition at 50 K was observed in the temperature dependence of Seebeck coefficient, electrical resistivity, and magnetization curves. The bifurcation point between zero field cooled and field cooled magnetization occurred at 350 K. A ferromagnetic-type behavior was observed over a temperature range from 10 to 300 K, confirming the re-entrant spin-glass state. Where the determined magnetization and coercive field are small, around 7 emu cm(-3) and 300 Oe at 10 K, respectively. Our work provided a study on thermoelectric and magnetic properties of re-entrant spin-glass FeAs in thin film form
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页数:5
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