Recent investigations on spin-transfer-torque-induced switching dynamics of perpendicular magnetic tunnel junctions (MTJ) have revealed different switching anomalies. Here, the influence of stray field from a synthetic anti-ferromagnet (SAF) based reference layer on the domain wall (DW) mediated switching of the free-layer magnet is studied via finite temperature micro-magnetic simulations for varying MTJ diameters. For larger diameters (similar to 80 - 120 nm), a stray field gives rise to persistent back-and-forth oscillation of the unswitched domain, delaying the switching process and causing increased write errors. For smaller diameters (similar to 30 - 56 nm), quasi-coherent switching occurs, as expected. For the intermediate ranges of MTJ diameters (similar to 60 - 70 nm), another switching mode emerges where a bubble-like feature is observed to evolve during the switching process, causing a very rapid change in magnetization. These paths are observed to originate from DWs partly in Bloch and partly in Neel configuration. We find that at the intermediate ranges of device size, the stray field becomes stronger for a given SAF configuration, and the energy difference between the Neel and Bloch configurations is also lowered. Hence, a stronger stray field could easily distort the DW propagation in the Walker breakdown regime, leading to such magnetization behavior. Our findings present interesting insights into DW-mediated switching modes in perpendicular MTJ structures caused by unoptimized stray fields from the SAF. (c) 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license(http://creativecommons.org/licenses/by/4.0/).
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Department of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, JapanDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Kubota, H.
Ando, Y.
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Department of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, JapanDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Ando, Y.
Miyazaki, T.
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Department of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, JapanDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Miyazaki, T.
Reiss, G.
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Department of Physics, University of Bielefeld, P.O. Box 100131, 33501 Bielefeld, GermanyDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Reiss, G.
Brückl, H.
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Department of Physics, University of Bielefeld, P.O. Box 100131, 33501 Bielefeld, GermanyDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Brückl, H.
Schepper, W.
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Department of Physics, University of Bielefeld, P.O. Box 100131, 33501 Bielefeld, GermanyDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Schepper, W.
Wecker, J.
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Siemens AG, Zentrale Technik ZT MFI, P.O. Box 3220, 91050 Erlangen, GermanyDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Wecker, J.
Gieres, G.
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Siemens AG, Zentrale Technik ZT MFI, P.O. Box 3220, 91050 Erlangen, GermanyDepartment of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan