Deep metric learning for few-shot image classification: A Review of recent developments

Few-shot image classification is a challenging problem that aims to achieve the human level of recognition based only on a small number of training images. One main solution to few-shot image classification is deep metric learning. These methods, by classifying unseen samples according to their distances to few seen samples in an embedding space learned by powerful deep neural networks, can avoid overfitting to few training images in few-shot image classification and have achieved the state-of-the-art performance. In this paper, we provide an up-to-date review of deep metric learning methods for few-shot image classification from 2018 to 2022 and categorize them into three groups according to three stages of metric learning, namely learning feature embeddings, learning class representations, and learning distance measures. Under this taxonomy, we identify the trends of transitioning from learning task-agnostic features to task-specific features, from simple computation of prototypes to computing task-dependent prototypes or learning prototypes, from using analytical distance or similarity measures to learning similarities through convolutional or graph neural networks. Finally, we discuss the current challenges and future directions of few-shot deep metric learning from the perspectives of effectiveness, optimization and applicability, and summarize their applications to real-world computer vision tasks.(c) 2023 Elsevier Ltd. All rights reserved.