The 28th IEEE European Test Symposium

被引：0

作者：

Karimi, Naghmeh ^{[1
]}

机构：

[1] Univ Maryland Baltimore Cty, Baltimore, MD 21250 USA

来源：

IEEE DESIGN & TEST | 2024年 / 41卷 / 01期

关键词：

D O I：

10.1109/MDAT.2023.3292800

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22-26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe's premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS'23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students). © 2023 IEEE.

引用

页码：91 / 92

页数：2

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