A Novel Detection and Localization Approach of Open-Circuit Switch Fault for the Grid-Connected Modular Multilevel Converter

被引:25
|
作者
Jin, Yu [1 ]
Xiao, Qian [2 ,3 ]
Jia, Hongjie [2 ,3 ]
Ji, Yanchao [1 ]
Dragicevic, Tomislav [4 ]
Teodorescu, Remus [5 ]
Blaabjerg, Frede [5 ]
机构
[1] Harbin Inst Technol, Dept Elect Engn & Automat, Harbin 150001, Peoples R China
[2] Tianjin Univ, Key Lab Smart Grid, Minist Educ, Tianjin 300072, Peoples R China
[3] Tianjin Univ, Key Lab Smart Energy & Informat Technol Tianjin M, Tianjin 300072, Peoples R China
[4] Tech Univ Denmark, Ctr Elect Power & Energy, DK-2800 Lyngby, Denmark
[5] Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark
基金
中国国家自然科学基金; 中国博士后科学基金; 英国工程与自然科学研究理事会;
关键词
Circuit faults; Switches; Capacitors; Location awareness; Voltage measurement; Fault detection; Current measurement; fault localization; modular multilevel converter (MMC); open-circuit fault; switch fault; H-BRIDGE; DIAGNOSIS;
D O I
10.1109/TIE.2022.3153810
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
The open-circuit fault detection and localization (FDL) technique can improve the reliability of the modular multilevel converter (MMC). However, the conventional software-based FDL methods usually have a heavy computation burden or a limited localization speed. This article proposes a simplified and fast software-based FDL approach for the grid-connected MMC. First, the errors between the measured state variables (the output current and the circulating current) and their estimated values are calculated. By comparing these errors with their threshold values, the switch fault can not only be detected but also be localized to the specific arm. Then, the capacitor voltages in this faulty arm are collected, and the submodule (SM) with the highest capacitor voltage is selected. To confirm the switch fault in this SM, a modified Pauta criterion is presented to check the abnormal voltage data. As a result, the computation burden of the proposed software-based FDL approach is significantly reduced, and the faulty SM can be localized in a short period. Simulation and experimental results verify that the proposed approach can effectively detect and localize different open-circuit faults, and it is immune to the step of power references.
引用
收藏
页码:112 / 124
页数:13
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