Diagnosis of Time-Sensitive Failures in Timed Discrete-Event Systems with Metric Interval Temporal Logics

被引:1
|
作者
Dong, Weijie [1 ,2 ]
Li, Shaoyuan [1 ,2 ]
Yin, Xiang [1 ,2 ]
机构
[1] Shanghai Jiao Tong Univ, Dept Automat, Shanghai 200240, Peoples R China
[2] Shanghai Jiao Tong Univ, Key Lab Syst Control & Informat Proc, Shanghai 200240, Peoples R China
基金
中国国家自然科学基金;
关键词
FAULT-DIAGNOSIS; DIAGNOSABILITY; CODIAGNOSABILITY;
D O I
10.1109/CDC49753.2023.10383314
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we address the problem of failure diagnosis in timed discrete-event systems modeled by timed automata. While existing works on this topic typically focus on failures modeled as particular events, many complex applications, especially time-critical systems, require the ability to identify time-sensitive failures associated with real-time information rather than just the occurrence of events at any time. To address this challenge, we propose the use of metric interval temporal logic (MITL) with continuous semantics on Boolean signals to formally describe time-sensitive failures. We introduce a novel concept called time-sensitive diagnosability (TS-diagnosability) to characterize whether or not any violation of the MITL task (i.e., failure) can be determined within a finite time elapsing. Furthermore, we provide a necessary and sufficient condition for verifying TS-diagnosability. Our results offer a more general framework for failure diagnosis of timed discrete-event systems.
引用
收藏
页码:6827 / 6833
页数:7
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