Robust estimation based on one-shot device test data under log-normal lifetimes

被引：1
|
作者：
Balakrishnan, N. [1 ]
Castilla, E. [2 ,3 ]
机构：
[1] McMaster Univ, Dept Math & Stat, Hamilton, ON, Canada
[2] Rey Juan Carlos Univ, Dept Matemat Aplicada, Madrid, Spain
[3] Rey Juan Carlos Univ, Dept Matemat Aplicada Ciencia & Ingn Mat & Tecnol, Mostoles Campus, Madrid 28933, Spain
来源：
STATISTICS | 2023年 / 57卷 / 05期
关键词：
Divergences; reliability; robustness; one-shot devices; LIFE-TEST PLANS; WEIBULL; MODEL;
D O I：
10.1080/02331888.2023.2240925
中图分类号：
O21 [概率论与数理统计]; C8 [统计学];
学科分类号：
020208 ; 070103 ; 0714 ;
摘要：
In this paper, we present robust estimators for one-shot device test data under log-normal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also developed. Their robustness feature is illustrated through a simulation study as well as two numerical examples.
引用
收藏
页码：1061 / 1086
页数：26
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