3-D PRINTED, COMPACT, TIME-OF-FLIGHT REFLECTRON MASS FILTERS

被引：0
|
作者：
Lubinsky, Nicholas [1 ]
Velasquez-Garcia, Luis [1 ]
机构：
[1] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
来源：
2023 IEEE 36TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IVNC | 2023年
关键词：
Additively manufactured mass spectrometry; compact mass spectrometry; glass ceramic; reflectron; time-of-flight; vat photopolymerization;
D O I：
10.1109/IVNC57695.2023.10189013
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report the design, fabrication, and characterization of novel, self-contained reflectron mass filters for compact mass spectrometry applications. A reflectron filters ions by mass-to-charge ratio via measuring the time-of-flight (TOF) of ions as they are reflected by the internal electromagnetic fields of the device, governed by the geometric constraints imposed. The devices are monolithically 3D-printed in glass-ceramic via vat photopolymerization. Experimental characterization of a fabricated prototype demonstrates the design can attain a mass resolution of about 41 Da for argon.
引用
收藏
页码：109 / 111
页数：3
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