An application of differential interference contrast in metallographic examination

被引:0
|
作者
Xiang CHEN
机构
关键词
difference interference contrast method; metallographic examination; and image analysis;
D O I
暂无
中图分类号
TF01 [冶金原理];
学科分类号
080601 ;
摘要
As one of the most exciting inspection and powerful analysis methods in modern materials metallographic examinations, the difference interference contrast (DIC) method has many advantages, including relatively low requirement for specimen preparation, obvious relief senses observed under microscope. Details such as fine structures or defects that are not or barely visible in incident-light bright field, could be easily revealed and thus make materials analysis more reliable. Differential interference contrast produces an image that can be readily manipulated using digital and video imaging techniques to further enhance contrast. But, studies of material metallography based on DIC method have rarely carried out. Based on the fundamental principle of the DIC method combing with the computer image analysis, applications of DIC method in materials metallographic examination were investigated in this study.
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页码:14 / 20
页数:7
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