A PROGRAM FOR QUANTITATIVE PIXE ANALYSIS OF THICK SAMPLE

被引：0
|
作者：
戴中宁
任炽刚
刘年庆
机构：
[1] Fudan University Shanghai 200433. China
[2] Fudan University Shanghai 200433. China
[3] Institute of High Energy Physics Academia Sinica Beijing 100080 China
来源：
Nuclear Science and Techniques | 1993年 / 04期
基金：
中国国家自然科学基金;
关键词：
Thick sample PIXE analysis TSPIXE;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable for the analysis of all elements with 11 < Z < 92. NBS reference materials were analyzed to provide the experimental test of TSPIXE program.
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页码：209 / 212
页数：4
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