一种并行内建自诊断测试嵌入式SRAM方案

被引：7

作者：

吴光林

胡晨

李锐

杨军

毛武晋

机构：

[1] 东南大学国家专用集成电路系统工程技术研究中心

来源：

关键词：

并行测试; 内建自测试; 诊断算法;

D O I：

暂无

中图分类号：

TP274.4 [];

学科分类号：

摘要：

本文提出了具有自诊断功能的位定向MARCH-TB算法和字定向MARCH-TBW算法,并且在这两个算法的基础上提出并行测试结构来实现了嵌入式内存的测试和诊断。实验结果表明,此测试算法具有故障覆盖率高,诊断故障能力强,测试需要的时间少等优点。

引用

页码：51 / 56

页数：6

共 12 条

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