Fault diagnosis and process monitoring using a statistical pattern framework based on a self-organizing map

被引:0
|
作者
宋羽 [1 ]
姜庆超 [1 ]
颜学峰 [1 ]
机构
[1] Key Laboratory of Advanced Control and Optimization for Chemical Processes of Ministry of Education(East China University of Science and Technology)
基金
中国国家自然科学基金; 中央高校基本科研业务费专项资金资助;
关键词
statistic pattern framework; self-organizing map; fault diagnosis; process monitoring;
D O I
暂无
中图分类号
TP277 [监视、报警、故障诊断系统];
学科分类号
0804 ; 080401 ; 080402 ;
摘要
A multivariate method for fault diagnosis and process monitoring is proposed. This technique is based on a statistical pattern(SP) framework integrated with a self-organizing map(SOM). An SP-based SOM is used as a classifier to distinguish various states on the output map, which can visually monitor abnormal states. A case study of the Tennessee Eastman(TE) process is presented to demonstrate the fault diagnosis and process monitoring performance of the proposed method. Results show that the SP-based SOM method is a visual tool for real-time monitoring and fault diagnosis that can be used in complex chemical processes.Compared with other SOM-based methods, the proposed method can more efficiently monitor and diagnose faults.
引用
收藏
页码:601 / 609
页数:9
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