Structural, optical and electrical properties of SnxSy thin films grown by spray ultrasonic

被引：0

作者：

I.B.Kherchachi ^{[1
]}

A.Attaf ^{[1
]}

H.Saidi ^{[1
]}

A.Bouhdjer ^{[1
]}

H.Bendjedidi ^{[1
]}

Y.Benkhetta ^{[1
]}

R.Azizi ^{[1
]}

机构：

[1] Physics of Thin Films and Applications Laboratory (LPCMA), University of Biskra

来源：

Journal of Semiconductors | 2016年 / 03期

关键词：

structural; tin sulfide; ultrasonic spray; optical and electrical properties;

D O I：

暂无

中图分类号：

TN304.2 [化合物半导体];

学科分类号：

0805 ; 080501 ; 080502 ; 080903 ;

摘要：

Tin sulfide(Snx Sy/ thin films were prepared by a spray ultrasonic technique on glass substrate at 300℃.The influence of deposition time tD2, 4, 6, 8 and 10 min on different properties of thin films, such as(XRD),photoluminescence(PL) and(UV) spectroscopy visible spectrum and four-point were investigated. X-ray diffraction showed that thin films crystallized in SnS, SnS, and SnSphases, but the most prominent one is SnS. The results of the(UV) spectroscopy visible spectrum show that the film which was deposited at 4 min has a large transmittance of 60% in the visible region. The photoluminescence spectra exhibited the luminescent peaks in the visible region, which shows its potential application in photovoltaic devices. The electrical resistivity(ρ) values of SnSfilms have changed from 8.1×10~4to 1.62Ω·cm with deposition time.

引用

页码：18 / 23

页数：6

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