Research on a Diamond Tip Wear Mechanism in Atomic Force Microscope-based Micro/nano-machining

被引:0
|
作者
赵清亮
机构
关键词
Atomic force microscope; diamond tip; single crystal silicon; micro/nano machining; chemical wear;
D O I
暂无
中图分类号
O485 [表面物理学];
学科分类号
070205 ; 0805 ; 080502 ; 0809 ;
摘要
The object is to investigate the wear of an atomic force microscope (AFM) diamond tip when conducting micro/nano machining on single crystal silicon surface. The experimental research and theoretical analysis were carried out on the worn tip in terms of wear rate, wear mechanism and the effect of the tip wear on micro machining process. The wear rate was calculated as 1.7(10~10mm 3/(N·m) by using a theoretical model combined with the experimental results. Through an integration of an AFM observation on the worn tip features with the FEM simulation of the stress distribution, in addition to the unit cutting force calculation on the AFM diamond tip, the wear mechanism of the AFM diamond tip was concluded as mainly chemical wear, and the wear process was also elaborated as well.
引用
收藏
页码:84 / 89
页数:6
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