Surface traps-related nonvolatile resistive switching memory effect in a single SnO2:Sm nanowire
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作者:
Huiying Zhou
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Computer and Information Engineering School, Central South University of Forestry and TechnologyComputer and Information Engineering School, Central South University of Forestry and Technology
Huiying Zhou
[1
]
Haiping Shi
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Nanoscale Science and Technology Laboratory, Institute for Advanced Study, Nanchang UniversityComputer and Information Engineering School, Central South University of Forestry and Technology
Haiping Shi
[2
]
Baochang Cheng
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Nanoscale Science and Technology Laboratory, Institute for Advanced Study, Nanchang University
School of Materials Science and Engineering, Nanchang UniversityComputer and Information Engineering School, Central South University of Forestry and Technology
Baochang Cheng
[2
,3
]
机构:
[1] Computer and Information Engineering School, Central South University of Forestry and Technology
[2] Nanoscale Science and Technology Laboratory, Institute for Advanced Study, Nanchang University
[3] School of Materials Science and Engineering, Nanchang University
For nanostructure SnO, it is very difficult for its electric properties to accurately control due to the presence of abundant surface states. The introduction of Sm can improve the traps in surface space charge region of SnOnanowires, resulting in a controllable storage charge effect. For the single nanowire-based two-terminal device, two surface state-related back-to-back diodes are formed. At a relatively large voltage, electrons can be injected into the traps in surface space charge region from negative electrode, resulting in a decrease of surface barrier connected with negative electrode, and contrarily electrons can be extracted from the traps in surface space charge region into positive electrode, resulting in an increase of surface barrier connected with positive electrode. The reversible injection and extraction induce a nonvolatile resistive switching memory effect.
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Computer and Information Engineering School, Central South University of Forestry and Technology Computer and Information Engineering School, Central South University of Forestry and Technology
Huiying Zhou
Haiping Shi
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School of Materials Science and Engineering, Nanchang University Computer and Information Engineering School, Central South University of Forestry and Technology
Haiping Shi
Baochang Cheng
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机构:
School of Materials Science and Engineering, Nanchang University
Nanoscale Science and Technology Laboratory, Institute for Advanced Study, Nanchang Computer and Information Engineering School, Central South University of Forestry and Technology
机构:
Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, JapanOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Nagashima, Kazuki
Yanagida, Takeshi
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Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, JapanOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Yanagida, Takeshi
Oka, Keisuke
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Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, JapanOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Oka, Keisuke
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Taniguchi, Masateru
Kawai, Tomoji
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Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Konkuk Univ, Dept Phys, Div Quantum Phases & Devices, Seoul 143701, South KoreaOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Kawai, Tomoji
Kim, Jin-Soo
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Konkuk Univ, Dept Phys, Div Quantum Phases & Devices, Seoul 143701, South KoreaOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
Kim, Jin-Soo
Park, Bae Ho
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Konkuk Univ, Dept Phys, Div Quantum Phases & Devices, Seoul 143701, South KoreaOsaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
机构:
Hanyang Univ, Dept Phys, Seoul 133791, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Seoul 133791, South Korea
Lee, Dong Uk
Kim, Seon Pil
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Hanyang Univ, Dept Phys, Seoul 133791, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Seoul 133791, South Korea
Kim, Seon Pil
Kim, Eun Kyu
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Hanyang Univ, Dept Phys, Seoul 133791, South Korea
Hanyang Univ, Res Inst Nat Sci, Seoul 133791, South KoreaHanyang Univ, Dept Phys, Seoul 133791, South Korea
Kim, Eun Kyu
Cho, Won-Ju
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Kwangwoon Univ, Dept Elect Mat Engn, Seoul 139701, South KoreaHanyang Univ, Dept Phys, Seoul 133791, South Korea
Cho, Won-Ju
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Kim, Young-Ho
Im, Hyunsik
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Dongguk Univ, Dept Semicond Sci, Seoul 100715, South KoreaHanyang Univ, Dept Phys, Seoul 133791, South Korea
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Department of Applied Physics, Delhi Technological University, Delhi,110042, IndiaDepartment of Applied Physics, Delhi Technological University, Delhi,110042, India
Komal, Km
Gupta, Govind
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Sensor Devices & Metrology, CSIR-National Physics Laboratory (CSIR), Delhi,110012, IndiaDepartment of Applied Physics, Delhi Technological University, Delhi,110042, India
Gupta, Govind
Singh, Mukhtiyar
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Department of Applied Physics, Delhi Technological University, Delhi,110042, IndiaDepartment of Applied Physics, Delhi Technological University, Delhi,110042, India
Singh, Mukhtiyar
Singh, Bharti
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Department of Applied Physics, Delhi Technological University, Delhi,110042, IndiaDepartment of Applied Physics, Delhi Technological University, Delhi,110042, India