Surface diffusion of Si, Ge and C adatoms on Si (001) substrate studied by the molecular dynamics simulation

被引:0
|
作者
陈智辉
俞重远
芦鹏飞
刘玉敏
机构
[1] Institute of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
[2] Key Laboratory of Information Photonics and Optical Communications, Ministry of Education
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
molecular dynamics simulations; Tersoff potential; surface diffusion; potential energy;
D O I
暂无
中图分类号
O472.1 [];
学科分类号
070205 ; 080501 ; 0809 ; 080903 ;
摘要
Depositions of Si, Ge and C atoms onto a preliminary Si (001) substrate at different temperatures are investigated by using the molecular dynamics method. The mechanism of atomic self-assembling occurring locally on the flat terraces between steps is suggested. Diffusion and arrangement patterns of adatoms at different temperatures are observed. At 900 K, the deposited atoms are more likely to form dimers in the perpendicular [110] direction due to the more favourable movement along the perpendicular [110] direction. C adatoms are more likely to break or reconstruct the dimers on the substrate surface and have larger diffusion distances than Ge and Si adatoms. Exchange between C adatoms and substrate atoms are obvious and the epitaxial thickness is small. Total potential energies of adatoms and substrate atoms involved in the simulation cell are computed. When a newly arrived adatom reaches the stable position, the potential energy of the system will decrease and the curves turns into a ladder-like shape. It is found that C adatoms can lead to more reduction of the system energy and the potential energy of the system will increase as temperature increases.
引用
收藏
页码:4591 / 4597
页数:7
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