Direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene via van der Pauw geometry

被引：0
|
作者：
马瑞松 [1 ,2 ,3 ]
郇庆 [1 ,2 ,3 ]
吴良妹 [1 ,2 ,3 ]
严佳浩 [1 ,2 ,3 ]
张余洋 [2 ]
鲍丽宏 [1 ,2 ,3 ]
刘云圻 [4 ]
杜世萱 [1 ,2 ,3 ]
高鸿钧 [1 ,2 ,3 ]
机构：
[1] Institute of Physics & School of Physical Sciences,University of Chinese Academy of Sciences (CAS)
[2] CAS Key Laboratory of Vacuum Physics,University of Chinese Academy of Sciences
[3] Beijing Key Laboratory for Nanomaterials and Nanodevices
[4] Institute of Chemistry,Chinese Academy of Sciences
来源：
Chinese Physics B | 2017年 / 26卷 / 06期
基金：
中国国家自然科学基金;
关键词：
graphene conductivity; mobility; four-probe measurement; van der Pauw method;
D O I：
暂无
中图分类号：
TQ127.11 [];
学科分类号：
0817 ;
摘要：
We report the direct measurements of conductivity and mobility in millimeter-sized single-crystalline graphene on SiO;/Si via van der Pauw geometry by using a home-designed four-probe scanning tunneling microscope（4P-STM）. The gate-tunable conductivity and mobility are extracted from standard van der Pauw resistance measurements where the four STM probes contact the four peripheries of hexagonal graphene flakes, respectively. The high homogeneity of transport properties of the single-crystalline graphene flake is confirmed by comparing the extracted conductivities and mobilities from three setups with different geometry factors. Our studies provide a reliable solution for directly evaluating the entire electrical properties of graphene in a non-invasive way and could be extended to characterizing other two-dimensional materials.
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页码：307 / 314
页数：8
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