10th International Conference on Electronic Measurement & Instruments

被引：0

作者：

机构：

来源：

电子测量技术 | 2011年 / 02期

关键词：

test; Instruments; International Conference on Electronic Measurement; IEEE; CIE; cycle;

D O I：

暂无

中图分类号：

TN06-2 [];

学科分类号：

080901 ;

摘要：

The International Conference on Electronic Measurement & Instruments (ICEMI) is the world’s premier conference dedicated to the electronic test of devices,boards and systems--covering the complete cycle from design verification,test,diagnosis,failure analysis and back to process and design improvement

引用

页码：110 / 111

页数：2