Effect of SiO2 on the thermal stability and spectroscopic properties of Er3+-doped tellurite glasses

被引：0
|
作者：
郑世超 [1 ]
周亚训 [1 ]
机构：
[1] College of Information Science and Engineering,Ningbo University
来源：
Optoelectronics Letters | 2014年 / 10卷 / 03期
基金：
中国国家自然科学基金;
关键词：
SiO; doped tellurite glasses; Effect of SiO2 on the thermal stability and spectroscopic properties of Er;
D O I：
暂无
中图分类号：
TN304.21 [];
学科分类号：
摘要：
Er3+-doped tellurite glass(TeO2-ZnO-Na2O) prepared using the conventional melt-quenching method is modified by introducing the SiO2,and its effects on the thermal stability of glass host and the 1.53 μm band spectroscopic properties of Er3+ are investigated by measuring the absorption spectra,1.53 μm band fluorescence spectra,Raman spectra and differential scanning calorimeter(DSC) curves.It is found that for Er3+-doped tellurite glass,besides improving its thermal stability,introducing SiO2 is helpful for the further improvement of the fluorescence full width at half maximum(FWHM) and bandwidth quality factor.The results indicate that the prepared Er3+-doped tellurite glass containing an appropriate amount of SiO2 has good prospect as a candidate of gain medium applied for 1.53 μm broadband amplifier.
引用
收藏
页码：209 / 212
页数：4
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