共 50 条
- [3] Exploiting an I-IP for in-field SOC test 19TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2004, : 404 - 412
- [5] FACET METHOD FOR NATURAL FIELD APPROXIMATION RAIRO-INFORMATIQUE-COMPUTER SCIENCE, 1979, 13 (02): : 205 - 216
- [6] A New Method of Field MRTD Test 7TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, 2014, 9282