Chemical states of the atoms in magnetic multilayers Ta/NiOx/Ni81Fe19/Ta and Co/AlOx/Co

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作者
YU Guanghua
机构
关键词
NiOx/NiFe; exchange coupling; Co/AlOx/Co; X-ray pho-toelectron spectroscopy (XPS); chemical states;
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中图分类号
O484.1 [薄膜的生长、结构和外延];
学科分类号
080501 ; 1406 ;
摘要
Ta/NiOx/Ni81Fe19/Ta and Co/AlOx/Co multilay-ers were prepared by rf reactive and dc magnetron sputter-ing. The exchange coupling field (Hex) and the coercivity (Hc) of NiOx/Ni81Fe19 as a function of the ratio of Ar to O2 during the deposition process were studied. The composition and chemical states at the interface region of NiOx/NiFe were also investigated using the X-ray photoelectron spectroscopy (XPS) and peak decomposition technique. The results show that when the ratio of Ar to O2 is equal to 7 and the argon sputtering pressure is 0.57 Pa, the x value is approximately 1 and the valence of nickel is +2. At this point, NiOx is anti-ferromagnetic NiO and the corresponding Hex is the largest. As the ratio of Ar/O2 deviates from 7, the Hex will decrease due to the presence of magnetic impurities such as Ni+3 or metallic Ni at the interface region of NiOx/NiFe, while the Hc will increase due to the metallic Ni. Al layers in Co/AlOx/Co multilayers were also studied by angle-resolved XPS. Our finding is t
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页码:276 / 279
页数:4
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