SYNTHESIS AND X-RAY POWDER DIFFRACTION DATA OF A NEW COMPOUND:K6FeNb15O42

被引:0
|
作者
方亮
机构
关键词
K2O-Fe2O3-Nb2O3; system; new com-pound; powder diffraction data;
D O I
暂无
中图分类号
TB44 [粉末技术];
学科分类号
0805 ;
摘要
A new compound KFeNbOwas prepared for the first time by solid state reaction in KO FeO-NbOternary system. The X-ray powder diffraction data of the title compound was measured. KFeNbOcrystallizes in the hexagonal system with unit cell parameters a=9.1320(4)(?),c=12.0670(9)(?), and space group P63/mcm(193), z=1. The calculated and mea sured densities are 4.489 g/cm~3 and 4.485 g.cm~3, respec tively.
引用
收藏
页码:7 / 9
页数:3
相关论文
共 50 条
  • [2] Synthesis and X-ray powder diffraction data of a new compound:: K6FeNb15O42
    Fang, L
    Zhang, H
    Qing, LQ
    Wu, BL
    JOURNAL OF WUHAN UNIVERSITY OF TECHNOLOGY-MATERIALS SCIENCE EDITION, 1998, 13 (03): : 7 - 9
  • [3] Synthesis and X-ray powder diffraction data of a new compound:: K6FeNb15O42
    Fang, L
    Zhang, H
    Qing, LQ
    Wu, BL
    JOURNAL OF WUHAN UNIVERSITY OF TECHNOLOGY-MATERIALS SCIENCE EDITION, 1998, 13 (02): : 16 - 18
  • [4] X-RAY POWDER DIFFRACTION DATA FOR A NEW PIRAZOLINE COMPOUND
    Delgado, Gerzon E.
    Delgado-Nino, Pilar
    Lobaton, Robert
    Liew, Suk-Ming
    Jamalis, Joazaizulfazli
    PERIODICO TCHE QUIMICA, 2019, 16 (33): : 524 - 529
  • [5] X-ray powder diffraction data for compound DyNiSn
    Nong, LQ
    Zeng, LM
    Hao, JM
    POWDER DIFFRACTION, 1997, 12 (03) : 134 - 135
  • [6] X-ray powder diffraction data for compound DyNiSn
    Nong, Liangqin
    Zeng, Lingmin
    Hao, Jianmin
    Powder Diffraction, 1997, 12 (03): : 134 - 135
  • [7] 新铌酸盐化合物K6FeNb15O42的合成
    方亮
    张辉
    吴伯麟
    袁润章
    化学通报, 1999, (03) : 40 - 41
  • [9] Synthesis and X-ray powder study of a new compound:Ba6Ti7Nb9O42
    Fang, L
    Zhang, H
    Qing, LQ
    Wu, BL
    JOURNAL OF WUHAN UNIVERSITY OF TECHNOLOGY-MATERIALS SCIENCE EDITION, 1998, 13 (04): : 42 - 44
  • [10] X-ray powder diffraction data of a new compound AS2MoO7
    Hums, E
    POWDER DIFFRACTION, 2000, 15 (04) : 239 - 240