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Failure characterization at head/disk interface of hard disk drive

被引：0
|
作者：
YANG Mingchu
LUO Jianbin
WEN Shizhu
WANG Wei
HUANG Qing
HAO Caiwang 1. State Key Laboratory of Tribology
2. Institute of Information Materials Engineering
3. University of Southwest Jiaotong University
机构：
来源：
Science China Mathematics | 2001年 / S1期
关键词：
media scratch; particles; AES; TOF-SIMS; SEM/EDX;
D O I：
暂无
中图分类号：
TP333 [存贮器];
学科分类号：
081201 ;
摘要：
The characterization of sub-micron features and particles between hard disk interface(HDI) is becoming even more important to the hard disk industry in the fields of corrosion, tribologyand the contamination. In this paper, media scratch and particles are characterized with AES,TOF-SIMS, SEM/EDX and LPC. The main causes resulted in serious media scratch have beenanalyzed and discussed.
引用
收藏
页码：407 / 411
页数：5
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