FabricationofanovelRFswitchdevicewithhighperformanceusingIn0.4Ga0.6AsMOSFETtechnology<spanid="corr-video"class="type"style="display:none">附视频</span>

被引:0
|
作者
周佳辉 [1 ,2 ]
常虎东 [2 ]
张旭芳 [1 ]
杨靖治 [1 ]
刘桂明 [1 ]
李海鸥 [2 ]
刘洪刚 [1 ]
机构
[1] Microwave Device and IC Department Institute of Microelectronics Chinese Academy of Sciences
[2] Guangxi Experiment Center of Information Science Guilin University of Electronic
关键词
RF switch; InGaAs; MOSFET; Ⅲ-Ⅴ; CMOS;
D O I
暂无
中图分类号
TN386 [场效应器件];
学科分类号
摘要
A novel radio frequency(RF) switch device has been successfully fabricated using InGaAs metaloxide-semiconductor field-effect transistor(MOSFET) technology.The device showed drain saturation currents of 250 mA/mm,a maximum transconductance of 370 mS/mm,a turn-on resistance of 0.72 mΩ·mm2 and a drain current on-off(Ion/Ioff) ratio of 1×10~6.The maximum handling power of on-state of 533 mW/mm and off-state of 3667 mW/mm is obtained.The proposed In0.4Ga0.6As MOSFET RF switch showed an insertion loss of less than 1.8 dB and an isolation of better than 20 dB in the frequency range from 0.1 to 7.5 GHz.The lowest insertion loss and the highest isolation can reach 0.27 dB and more than 68 dB respectively.This study demonstrates that the InGaAs MOSFET technology has a great potential for RF switch application.
引用
收藏
页码:81 / 84
页数:4
相关论文
共 6 条
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