A SOLUTION OF MINIMUM NORM FOR QUANTITATIVE PHASE ANALYSIS BY STANDARDLESS X-RAY DIFFRACTION

被引：0
|
作者：
ZHAO Han GONG Yansheng SHEN Jingyuan RUAN Qikuan JIN Jialing ZHU Hanyu Research Institute of Qiqihar Steel Works
机构：
来源：
Acta Metallurgica Sinica(English Letters) | 1990年 / 09期
关键词：
X-ray diffraction; standardless phase analysis; least square regression;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A new expression of quantitative phase analysis by standardless X-ray diffraction has beenderived using intensity matrix of vector modulus,The criterion of standardless X-raydiffraction analysis was suggested,so as to separate the diffraction pattern of every phasefrom that of sample.The optimal solution could be obtained by the least squares regression.
引用
收藏
页码：225 / 229
页数：5
相关论文
共 50 条
12345