MEASUREMENT OF ATOMIC CONCENTRATION PROFILES IN THIN-FILMS USING NONRESONANT NUCLEAR-REACTIONS

被引：9
|
作者：
WISE, PJ
BARNES, DG
NEILD, DJ
机构：
[1] UNIV MANCHESTER,DEPT PHYS,MANCHESTER M13 9PL,ENGLAND
[2] UNIV MANCHESTER,DEPT MET,MANCHESTER M13 9PL,ENGLAND
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1974年 / 7卷 / 11期
关键词：
D O I：
10.1088/0022-3727/7/11/307
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1475 / 1481
页数：7
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