Two-Step Process-Based Open-Circuit Fault Diagnosis for Three-Level NPC Converters

被引:0
|
作者
Zhang, Wenli [1 ]
Guan, Bo [1 ]
Chang, Yujie [1 ]
机构
[1] Chongqing Univ, Sch Elect Engn, Chongqing 400044, Peoples R China
来源
ELECTRONICS | 2025年 / 14卷 / 03期
基金
中国国家自然科学基金;
关键词
fault diagnosis; open-circuit fault; switching device; voltage residual; INVERTERS;
D O I
10.3390/electronics14030542
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Fast open-circuit (OC) fault diagnosis is essential to ensure that a multilevel inverter operates under stable conditions. Conventional diagnosis methods either require additional hardware sensors or complex calculations. However, these conditions are difficult to realize in some low-cost application scenarios. For this reason, a two-step process-based OC fault diagnosis method is proposed according to available data that can be acquired using the existing sensors in the application. At the same time, the proposed method does not involve complex and precise calculation. By analyzing the effects of an OC fault on the AC-side three-phase current, the faulty bridge arm can be quickly located via the average current. Furthermore, through establishing the calculation model of the neutral point potential, an accurate diagnosis of faulty switching devices can be achieved quickly and easily based on the residuals. The proposed OC fault diagnosis method is also proved to be correct and effective based on simulation and experience.
引用
收藏
页数:15
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