Nondestructive testing technologies, each based on different principles, exhibit inherent limitations when used in isolation. The integration of multiple testing technologies can mitigate these limitations, offering a more robust and comprehensive defect detection process. This study proposes a composite defect detection method that integrates digital shearing speckle pattern interferometry with infrared thermography. A unified excitation source is utilized to harmonize the optical paths, enabling synchronized data acquisition from these two technologies. The synthesized results are then analyzed to identify defects. Experimental findings indicate that the proposed method effectively combines the strengths of the two technologies, resulting in excellent defect detection performance in real-world scenarios.