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- [1] Thermally robust 90nm node Cu-Al wiring technology using solid phase reaction between Cu and Al Matsubara, Y. (matsubara2@selete.co.jp), 1600, (Institute of Electrical and Electronics Engineers Inc.):
- [2] Novel approach of die attach technology for SiC power module by pure Al thin film bonding 2021 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP 2021), 2021, : 99 - 100