Optimization of GEM detectors for applications in X-ray fluorescence imaging

被引:0
|
作者
de Souza, G. G. A. [1 ]
da Luz, H. N. [2 ]
Bregant, M. [1 ]
机构
[1] Univ Sao Paulo, Inst Fis, Rua Matao 1371 Cidade Univ, BR-05508090 Sao Paulo, Brazil
[2] Czech Tech Univ, Inst Expt & Appl Phys, Husova 5, Prague 1, Czech Republic
关键词
Gas Electron Multiplier; X-ray fluorescence imaging; GEM copper fluorescence; TRIPLE-GEM; SOFT; KR; AR;
D O I
10.1016/j.radphyschem.2024.112263
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this work a set of simulations that aim at the optimization of Micropattern Gaseous Detectors (MPGD) for applications in X-ray fluorescence imaging in the energy range of 3 - 30 keV is presented. By studying the statistical distribution of electrons from interactions of X-rays with gases, the energy resolution limits after charge multiplication for 6 keV X-ray photons in Ar/CO2(70/30) 2 (70/30) and Kr/CO2(90/10) 2 (90/10) were calculated, resulting in energy resolutions of 15.4(4)% and 14.6(2)% respectively. These two mixtures were studied in simulations to evaluate the advantages of using krypton-based mixtures to reduce the presence of escape peaks in fluorescence spectra. A model to evaluate the X-ray fluorescence from the conductive materials inside the detectors was implemented, serving as a tool to estimate the extent of contamination of fluorescence spectra when using copper or aluminum layers in the material composition of MPGDs.
引用
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页数:8
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