A first-principles study of Hoffmann-type ultra-wide bandgap semiconductor material

被引:0
|
作者
Liu, Jie [1 ]
Qiao, Qiangqiang [1 ]
Zhang, Jinsen [1 ]
Ren, Ziang [1 ]
Zou, Shihui [1 ]
Liu, Yujing [1 ]
Luo, Jianmin [1 ]
Yuan, Huadong [1 ]
Nai, Jianwei [1 ]
Wang, Yao [1 ,2 ]
Tao, Xinyong [1 ]
机构
[1] Zhejiang Univ Technol, Coll Mat Sci & Engn, Hangzhou 310014, Peoples R China
[2] Zhejiang Univ Technol, Moganshan Res Inst Deqing Cty, Huzhou 313000, Peoples R China
基金
中国博士后科学基金; 中国国家自然科学基金;
关键词
Hofmann-type material; MOF; mechanical property; optical property; transport property; MOLECULAR-DYNAMICS SIMULATION; METAL-ORGANIC FRAMEWORK; ELECTRONIC-STRUCTURE; SPIN-CROSSOVER; HOFMANN; FILM; CO2;
D O I
10.1088/1361-6528/adc4f0
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A novel Hoffmann-type metal-organic framework ultra-wide bandgap semiconductor material, {Ni(DMA)2[Ni(CN)4]}(DMA denotes dimethylamine), has been predicted. The material has been named Ni-DMA-Ni, and its structure, stability, electronic, mechanical, optical, and transport properties have been investigated by first-principles simulations. The calculation results demonstrate that Ni-DMA-Ni exhibits excellent thermal and dynamics stability at room temperature, with a bandgap value as high as 4.89 eV and the light absorption capacity reaches 105 cm-1 level in the deep ultraviolet region. The Young's modulus is 27.94 GPa, and the shear modulus is 10.82 GPa, indicating mechanical anisotropy. In addition, the construction of a two-probe device utilizing Ni-DMA-Ni to evaluate its transport properties revealed a negative differential resistance effect in its I-V characteristic curve. These unique properties highlight the potential application of the Ni-DMA-Ni material in the deep ultraviolet optoelectronic field. This study provides novel concepts and contributes significant insights to the research of Hoffmann-type semiconductor materials in the field of optoelectronic devices.
引用
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页数:10
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