Stochastic Aware Modeling of Voltage Controlled Magnetic Anisotropy MRAM

被引:0
|
作者
Wang, Bowen [1 ,2 ]
Garcia-Redondo, Fernando [1 ]
Bardon, Marie Garcia [1 ]
Oh, Hyungrock [1 ]
Gupta, Mohit [3 ]
Kim, Woojin [1 ]
Favaro, Diego [1 ]
Chen, Yukai [1 ]
Dehaene, Wim [1 ,2 ]
机构
[1] IMEC, B-3001 Leuven, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn, MICAS Grp, B-3001 Leuven, Belgium
[3] Axelera AI, B-3000 Leuven, Belgium
关键词
VCMA; MRAM; Verilog-A; compact model; stochasticity; probabilistic-switching; SPINTRONICS; MEMORY;
D O I
10.1109/TNANO.2024.3361718
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a physics-based compact model for Voltage-Controlled Magnetic Anisotropy (VCMA) MRAM, calibrated against fabricated devices. Our model addresses inherent stochasticity, offering a robust tool for the design and simulation of VCMA MRAM peripheral circuits. Achieving a tenfold increase in simulation speed compared to existing stochastic Landau-Lifshitz-Gilbert-Slonczewski (sLLGS) based models (10x to 100x), and overcoming accuracy problems related to VCMA macro-spin sLLGS simulations, our approach enables efficient exploration of MRAM based circuits. The model efficiency and accuracy are demonstrated through a practical use case.
引用
收藏
页码:144 / 150
页数:7
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