Electromigration based Hardware Trojan Defense in Integrated Circuit

Recently, Hardware Trojans are gaining increasing attention due to their ability to cause damage to critical circuits through covert attack methods, which poses significant threats to electronic systems. Among the various attack methods of Hardware Trojans, those based on electromigration (EM) induced circuit aging are particularly feasible. In this paper, we investigate Hardware Trojan defense in integrated circuits based on an advanced three-dimensional physical electromigration model. By extracting characteristic structures from specific circuits, we conduct the electromigration failure analysis and propose Hardware Trojan defense strategy based on specific interconnect structures. Through these works, we demonstrate the vulnerable attacking locations of different interconnect structures and provide the guidance for electromigration based Hardware Trojans defense in IC design.