Three-dimensional microstructural characterization of a polycrystalline cubic boron nitride composite by means of focused ion beam (FIB) tomography

被引:0
|
作者
Gordon, S. [1 ,2 ]
Rodriguez-Suarez, T. [3 ]
Roa, J. J. [1 ]
Jimenez-Pique, E.
Llanes, L. [2 ]
机构
[1] Univ Politecn Cataluna, Dept Mat Sci & Engn, CIEFMA,BarcelonaTech, EEBE, Campus Diag Besos, Barcelona 08019, Spain
[2] Univ Politecn Cataluna, Barcelona Res Ctr Multiscale Sci & Engn, BarcelonaTech, Campus Diag Besos, Barcelona 08019, Spain
[3] Element Six UK Ltd, Global Innovat Ctr, Fermi Ave,Harwell Oxford, Didcot OX11 0QR, Oxon, England
关键词
3D FIB/FESEM tomography; Microstructural characterization; PcBN; Composite material; TOOL WEAR MECHANISMS; CUTTING-TOOL; PCBN; BEHAVIOR; TEM; FRACTURE; IMPLEMENTATION; PERFORMANCE; MICROSCOPY; CORROSION;
D O I
10.1016/j.ijrmhm.2025.107045
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The focused ion beam (FIB) tomography technique has been used to conduct a detailed study of the microstructural assemblage of a polycrystalline cubic boron nitride (PcBN) composite. In doing so, similar to 400 slices (i.e. two-dimensional (2D) field emission scanning electron microscope images) have been sequentially milled and reconstructed, resulting in a cube of 10.8 x 4.3 x 8.1 mu m(3). The three-dimensional (3D) microstructural characteristics of a high cBN content and metallic binder PcBN composite have been assessed and compared to those determined using a conventional 2D - linear intercept method (LIM). Results demonstrated FIB tomography to be a suitable and powerful technique for gaining in-depth knowledge and understanding of the microstructural assemblage of PcBN composite materials. In general, a satisfactory agreement is found between 2D and 3D characterization techniques. Nevertheless, 3D reconstruction provides information impossible to gather with conventional LIM. First, analysis of the phase content distribution in 3D permits to determine a homogeneous distribution of the cBN particles along the bulk material. Second, 3D tomography allows for assessment of geometrical aspects while also considering a greater number of cBN particles. As a consequence, they are found to exhibit a bimodal distribution rather than a monomodal one, with larger and finer particles showing a tetrahedral-like or a close-to-sphere geometry, respectively. Finally, binder reconstruction reveals the metallic matrix to be a contiguous and interconnected network through the cBN skeleton. In this regard, some discrepancies in the binder mean free path calculations between 2D and 3D methodologies are discerned.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] Three-Dimensional Microstructural Characterization Using Focused Ion Beam Tomography
    Michael D. Uchic
    Lorenz Holzer
    Beverley J. Inkson
    Edward L. Principe
    Paul Munroe
    MRS Bulletin, 2007, 32 : 408 - 416
  • [2] Three-dimensional microstructural characterization using focused ion beam tomography
    Uchic, Michael D.
    Holzer, Lorenz
    Inkson, Beverley J.
    Principe, Edward L.
    Munroe, Paul
    MRS BULLETIN, 2007, 32 (05) : 408 - 416
  • [3] Microstructural characterization of plutonium oxalate and oxide particles by three-dimensional focused ion beam tomography
    Chung, Brandon W.
    Torres, Richard A.
    MATERIALIA, 2019, 6
  • [4] Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography
    Singh, Sudhanshu S.
    Loza, Jose J.
    Merlde, Arno P.
    Chawla, Nikhilesh
    MATERIALS CHARACTERIZATION, 2016, 118 : 102 - 111
  • [5] Advances in Focused Ion Beam Tomography for Three-Dimensional Characterization in Materials Science
    Mura, Francesco
    Cognigni, Flavio
    Ferroni, Matteo
    Morandi, Vittorio
    Rossi, Marco
    MATERIALS, 2023, 16 (17)
  • [6] Three-dimensional microstructural characterization of bulk plutonium and uranium metals using focused ion beam technique
    Chung, Brandon W.
    Erler, Robert G.
    Teslich, Nick E.
    JOURNAL OF NUCLEAR MATERIALS, 2016, 473 : 264 - 271
  • [7] Multiscale microstructural characterization of Sn-rich alloys by three dimensional (3D) X-ray synchrotron tomography and focused ion beam (FIB) tomography
    Yazzie, K. E.
    Williams, J. J.
    Phillips, N. C.
    De Carlo, F.
    Chawla, N.
    MATERIALS CHARACTERIZATION, 2012, 70 : 33 - 41
  • [8] Three-Dimensional Semiconductor Device Investigation Using Focused Ion Beam and Scanning Electron Microscopy Imaging (FIB/SEM Tomography)
    Lepinay, K.
    Lorut, F.
    MICROSCOPY AND MICROANALYSIS, 2013, 19 (01) : 85 - 92
  • [9] Three-dimensional nanostructures by focused ion beam techniques: Fabrication and characterization
    Wuxia Li
    Changzhi Gu
    Ajuan Cui
    J.C. Fenton
    Qianqing Jiang
    P.A. Warburton
    Tiehan H. Shen
    Journal of Materials Research, 2013, 28 : 3063 - 3078
  • [10] Three-dimensional nanostructures by focused ion beam techniques: Fabrication and characterization
    Li, Wuxia
    Gu, Changzhi
    Cui, Ajuan
    Fenton, J. C.
    Jiang, Qianqing
    Warburton, P. A.
    Shen, Tiehan H.
    JOURNAL OF MATERIALS RESEARCH, 2013, 28 (22) : 3063 - 3078