Multiple Transient Voltage Suppressor Diodes-Based Protection Circuits with Decreasing Loading Effect Under High-Power Microwave Pulses

被引:0
|
作者
Zhang, Yue [1 ]
Zhou, Liang [1 ]
机构
[1] Shanghai Jiao Tong Univ, Key Lab Minist Educ Design & Electromagnet Compat, Shanghai, Peoples R China
基金
中国国家自然科学基金;
关键词
multiple transient voltage suppressor (TVS) diodes; high-power microwave (HPM); intentionally electromagnetic interference (IEMI); overshoot protection ratio (PR);
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
This study demonstrates multiple transient vo Abstract-This study demonstrates multiple transient voltage suppressor (TVS) diodes-based protection circuits under high-power microwave (HPM) pulses to protect sensitive semiconductor and microwave devices from interference or even damaged by intentionally electromagnetic interference (IEMI). Firstly, the nonlinear large signal model of two adopted types of TVS diodes are studied. Secondly, a transmission line (TL) is applied to compensate degrade of RF performance resulted from TVS diode capacitance. Therefore, protection circuits based on multiple TVS diodes are proposed and measured under HPM pulses with their overshoot protection ratio (PR) recorded. The highest overshoot protection ratio (PR) of these circuits is approximately 17-20 dB when the input HPM pulse power ranges from 50 to 63 dBm. Measured results are correlated with simulated results.
引用
收藏
页码:417 / 420
页数:4
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