liquid film;
film thickness;
film temperature;
absorption spectroscopy;
wetting;
interfacial flow;
multiphase flow;
OPTICAL MEASUREMENT;
WAVE VELOCITY;
LIQUID;
FLOW;
THIN;
D O I:
10.1088/1361-6501/ad93f1
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
This paper assesses broadband absorption spectroscopy for calibration-free, single-ended thickness and temperature measurements of thin liquid films with a free interface using spectrally resolved intensity measurements. The spectroscopic properties of the liquid in question, here an oil lubricant, are characterized using a Fourier transform infrared spectrometer. This data forms the basis for a measurement model that is used to infer the thickness and temperature of films wetting metal surfaces based on broadband spectral transmission measurements. The technique is demonstrated by inferring the properties of static films of known properties as well as free films on a rotating metal disk.
机构:
Tampere Univ, Phys Unit, Photon Lab, Tampere, FinlandTampere Univ, Phys Unit, Photon Lab, Tampere, Finland
Rossi, Jussi
Vainio, Markku
论文数: 0引用数: 0
h-index: 0
机构:
Tampere Univ, Phys Unit, Photon Lab, Tampere, Finland
Univ Helsinki, Dept Chem, Helsinki, FinlandTampere Univ, Phys Unit, Photon Lab, Tampere, Finland