In GaN-based laser diode (LD) structures, it is essential to optimize the doping concentration and profiles in p-type-doped layers because of the trade-off between laser power and operation voltage as the doping concentration varies. In this study, we proposed GaN-based blue LD structures with nonuniform doping distributions in the p-AlGaN cladding layer to reduce the modal loss and demonstrated improved efficiency characteristics using numerical simulations. We compared the laser power, operation voltage, and wall-plug efficiency (WPE) of LDs with uniform, linear, and quadratic doping profiles in the p-AlGaN cladding layer. As the doping concentration becomes increasingly inhomogeneous, the laser output power increases significantly because of the reduced overlap of the laser mode with the p-AlGaN cladding layer. However, this nonuniform doping profile also leads to an increase in the operation voltage due to the expansion of the low-doping region. By optimizing the nonuniform doping distribution in the p-type cladding layer, the WPE was found to be improved by over 5% compared to a conventional uniformly doped p-cladding layer. The proposed design of LD structures is expected to enhance the efficiency of high-power GaN-based LDs.
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Univ Chinese Acad Sci, Coll Mat Sci & Optoelect Technol, Beijing 100049, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Hou, Yufei
Zhao, Degang
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Zhao, Degang
Liang, Feng
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Liang, Feng
Liu, Zongshun
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Liu, Zongshun
Yang, Jing
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
Yang, Jing
Chen, Ping
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Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China
机构:
Suzhou Institute of Nano-tech and Nano-bionics Chinese Academy of Sciences
School of Nano-tech and Nano-bionics University of Science and Technology of ChinaSuzhou Institute of Nano-tech and Nano-bionics Chinese Academy of Sciences
机构:
State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
Key Laboratory of Electronic Materials and Devices of Tianjin, School of Electronics and Information Engineering, Hebei University of Technology
Hebei Key Laboratory of Advanced Laser Technology and EquipmentState Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
韩磊
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高元斌
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杭升
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楚春双
张勇辉
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State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
Key Laboratory of Electronic Materials and Devices of Tianjin, School of Electronics and Information Engineering, Hebei University of Technology
Hebei Key Laboratory of Advanced Laser Technology and EquipmentState Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
张勇辉
郑权
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Key Engineering Center of Flat-Panel-Display Glass and EquipmentState Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
郑权
李青
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Key Engineering Center of Flat-Panel-Display Glass and EquipmentState Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
李青
张紫辉
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State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
Key Laboratory of Electronic Materials and Devices of Tianjin, School of Electronics and Information Engineering, Hebei University of Technology
Hebei Key Laboratory of Advanced Laser Technology and EquipmentState Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology
机构:
Jiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Cao, Yi-Wei
Lv, Quan-Jiang
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Jiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Lv, Quan-Jiang
Yang, Tian-Peng
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EpiTop Optoelect Co Ltd, Maanshan 243000, Peoples R China
Maanshan Jason Semicond Co Ltd, Maanshan 243000, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Yang, Tian-Peng
Mi, Ting-Ting
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Maanshan Jason Semicond Co Ltd, Maanshan 243000, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Mi, Ting-Ting
Wang, Xiao-Wen
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Maanshan Jason Semicond Co Ltd, Maanshan 243000, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Wang, Xiao-Wen
Liu, Wei
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Maanshan Jason Semicond Co Ltd, Maanshan 243000, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China
Liu, Wei
Liu, Jun-Lin
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Jiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R ChinaJiangsu Univ, Sch Mat Sci & Engn, Zhenjiang 212013, Peoples R China