Time performance of Analog Pixel Test Structures with in-chip operational amplifier implemented in 65 nm CMOS imaging process

被引：1

作者：

Rinella, Gianluca Aglieri

Aglietta, Luca ^{[1
,2
]}

Antonelli, Matias

Barile, Francesco ^{[9
,10
]}

Benotto, Franco

Beole, Stefania Maria ^{[1
,2
]}

Botta, Elena ^{[1
,2
]}

Bruno, Giuseppe Eugenio ^{[10
,11
]}

Carnesecchi, Francesca ^{[8
]}

Colella, Domenico ^{[9
,10
]}

Colelli, Angelo ^{[10
]}

Contin, Giacomo ^{[6
,7
]}

De Robertis, Giuseppe

Dumitrache, Floarea ^{[2
]}

Elia, Domenico ^{[10
]}

Ferrero, Chiara ^{[2
,3
]}

Fransen, Martin ^{[13
]}

Kluge, Alex

Kumar, Shyam ^{[10
]}

Lemoine, Corentin ^{[12
]}

Licciulli, Francesco ^{[10
]}

Lim, Bong-Hwi ^{[2
]}

Loddo, Flavio ^{[10
]}

Mager, Magnus ^{[8
]}

Marras, Davide ^{[4
,5
]}

Martinengo, Paolo ^{[8
]}

Pastore, Cosimo ^{[10
]}

Patra, Rajendra Nath ^{[15
]}

Perciballi, Stefania ^{[1
,2
]}

Piro, Francesco ^{[8
]}

Prino, Francesco ^{[2
]}

Ramello, Luciano ^{[2
,14
]}

Ramos, Arianna Grisel Torres

Reidt, Felix

Russo, Roberto ^{[13
]}

Sarritzu, Valerio

Savino, Umberto ^{[1
,2
]}

Schledewitz, David ^{[16
]}

Selina, Mariia

Senyukov, Serhiy ^{[12
]}

Sitta, Mario ^{[14
]}

Snoeys, Walter ^{[8
]}

Sonneveld, Jory ^{[13
]}

Suljic, Miljenko ^{[8
]}

Triloki, Triloki ^{[10
]}

Turcato, Andrea ^{[1
,2
]}

机构：

[1] Univ Torino, Dept Phys, Turin, Italy

[2] INFN, Sez Torino, Turin, Italy

[3] Polytech Torino, DET Dept, Turin, Italy

[4] Univ Cagliari, Cagliari, Italy

[5] INFN, Sez Cagliari, Cagliari, Italy

[6] Univ Trieste, Trieste, Italy

[7] INFN, Sez Trieste, Trieste, Italy

[8] European Org Nucl Res CERN, Geneva, Switzerland

[9] Univ Bari, Dept Phys, Bari, Italy

[10] INFN, Sez Bari, Bari, Italy

[11] Polytech Bari, Dept Phys DIF, Bari, Italy

[12] Univ Strasbourg, CNRS, IPHC, UMR 7178, Strasbourg, France

[13] Natl Inst Subat Phys Nikhef, Amsterdam, Netherlands

[14] Univ Piemonte Orientale, Vercelli, Italy

[15] Univ Jammu, Dept Phys, Jammu, India

[16] Heidelberg Univ, Heidelberg, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2025年 / 1070卷

基金：

新加坡国家研究基金会;

关键词：

Monolithic active pixel sensors; Solid state detectors; Silicon; CMOS; Particle detection; Test beam;

D O I：

10.1016/j.nima.2024.170034

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the context of the CERN EP R&D on monolithic sensors and the ALICE ITS3 upgrade, the Tower Partners Semiconductor Co (TPSCo) 65 nm process has been qualified for use in high energy physics, and adopted for the ALICE ITS3 upgrade. An Analog Pixel Test Structure (APTS) featuring fast per pixel operational-amplifier-based buffering for a small matrix of four by four pixels, with a sensor with a small collection electrode and a very non-uniform electric field, was designed to allow detailed characterization of the pixel performance in this technology. Several variants of this chip with different pixel designs have been characterized with a 120GeV/c positive hadron beam. This result indicates that the APTS-OA prototype variants with the best performance achieve a time resolution of 63 ps with a detection efficiency exceeding 99% and a spatial resolution of 2 mu m, highlighting the potential of TPSCo 65 nm CMOS imaging technology for high-energy physics and other fields requiring precise time measurement, high detection efficiency, and excellent spatial resolution.

引用

页数：15

共 20 条

[1] Digital pixel test structures implemented in a 65 nm CMOS process
Rinella, Gianluca Aglieri
Andronic, Anton
Antonelli, Matias
Aresti, Mauro
Baccomi, Roberto
Becht, Pascal
Beole, Stefania
Braach, Justus
Buckland, Matthew Daniel
Buschmann, Eric
Camerini, Paolo
Carnesecchi, Francesca
Cecconi, Leonardo
Charbon, Edoardo
Contin, Giacomo
Dannheim, Dominik
de Melo, Joao
Deng, Wenjing
di Mauro, Antonello
Hasenbichler, Jan
Hillemanns, Hartmut
Hong, Geun Hee
Isakov, Artem
Junique, Antoine
Kluge, Alex
Kotliarov, Artem
Krizek, Filip
Lautner, Lukas
Mager, Magnus
Marras, Davide
Martinengo, Paolo
Masciocchi, Silvia
Menzel, Marius Wilm
Munker, Magdalena
Piro, Francesco
Rachevski, Alexandre
Rebane, Karoliina
Reidt, Felix
Russo, Roberto
Sanna, Isabella
Sarritzu, Valerio
Senyukov, Serhiy
Snoeys, Walter
Sonneveld, Jory
Suljic, Miljenko
Svihra, Peter
Tiltmann, Nicolas
Usai, Gianluca
Van Beelen, Jacob Bastiaan
Vassilev, Mirella Dimitrova
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2023, 1056
[2] Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Aglieri Rinella, Gianluca
Alocco, Giacomo
Antonelli, Matias
Baccomi, Roberto
Beole, Stefania Maria
Blidaru, Mihail Bogdan
Buttwill, Bent Benedikt
Buschmann, Eric
Camerini, Paolo
Carnesecchi, Francesca
Chartier, Marielle
Choi, Yongjun
Colocci, Manuel
Contin, Giacomo
Dannheim, Dominik
De Gruttola, Daniele
Del Rio Viera, Manuel
Dubla, Andrea
di Mauro, Antonello
Donner, Maurice Calvin
Eberwein, Gregor Hieronymus
Egger, Jan
Fabbietti, Laura
Feindt, Finn
Gautam, Kunal
Gernhaeuser, Roman
Glover, James Julian
Gonella, Laura
Gran Grodaas, Karl
Gregor, Ingrid-Maria
Hillemanns, Hartmut
Huth, Lennart
Ilg, Armin
Isakov, Artem
Jones, Daniel Matthew
Junique, Antoine
Kaewjai, Jetnipit
Keil, Markus
Kim, Jiyoung
Kluge, Alex
Kobdaj, Chinorat
Kotliarov, Artem
Kittimanapun, Kritsada
Křížek, Filip
Kucharska, Gabriela
Kushpil, Svetlana
La Rocca, Paola
Laojamnongwong, Natthawut
Lautner, Lukas
Lemmon, Roy Crawford
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2024, 1069
[3] Performance of Monolithic Analog Pixel Test Structure with Operational Amplifier
Ferrero, C.
NUOVO CIMENTO C-COLLOQUIA AND COMMUNICATIONS IN PHYSICS, 2023, 46 (04):
[4] First measurements with monolithic active pixel test structures produced in a 65 nm CMOS process
Buckland, M.
JOURNAL OF INSTRUMENTATION, 2024, 19 (02)
[5] An Operational Amplifier for High Performance Pipelined ADCs in 65nm CMOS
Payami, Sima
Ojani, Amin
2012 NORCHIP, 2012,
[6] A 65 nm CMOS analog processor with zero dead time for future pixel detectors
Gaioni, L.
Braga, D.
Christian, D. C.
Deptuch, G.
Fahim, F.
Nodari, B.
Ratti, L.
Re, V.
Zimmerman, T.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2017, 845 : 595 - 598
[7] Design of an analog monolithic pixel sensor prototype in TPSCo 65 nm CMOS imaging technology
Deng, W.
Rinella, G. Aglieri
Aresti, M.
Baudot, J.
Benotto, F.
Beole, S.
Bialas, W.
Borghello, G.
Bugiel, S.
Campbell, M.
Carnesecchi, F.
Charbon, E.
Cecconi, L.
Colledani, C.
de Melo, J. L. A.
Martin, A. Dorda
Dorokhov, A.
Ferrero, C.
Hasenbichler, J.
Hong, G. H.
Hu, C.
Huang, G.
Kluge, A.
Kugathasan, T.
La Rocca, P.
Mager, M.
Marras, D.
Martinengo, P.
Munker, M.
Perciballi, S.
Piro, F.
Prino, F.
Rebane, K.
Reidt, F.
Sanna, I.
Sarritzu, V.
Savino, U.
Snoeys, W.
Suljic, M.
Termo, G.
Triffiro, A.
Turcato, A.
Usai, G.
Wu, Y.
JOURNAL OF INSTRUMENTATION, 2023, 18 (01)
[8] High Speed CMOS Pulse Generator Based on Analog Ramp Signal Implemented in 65nm CMOS Process Technology
Doloriel, Chandler Timm C.
Caberos, Aileen B.
ISCIT 2019: PROCEEDINGS OF 2019 19TH INTERNATIONAL SYMPOSIUM ON COMMUNICATIONS AND INFORMATION TECHNOLOGIES (ISCIT), 2019, : 578 - 583
[9] Discriminators in 65 nm CMOS process for high granularity, high time resolution pixel detectors
Ratti, L.
Manghisoni, M.
Re, V.
Traversi, G.
2013 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC), 2013,
[10] A 278 GHz heterodyne receiver with on-chip antenna for THz imaging in 65 nm CMOS process
Siligaris, A.
Andee, Y.
Mercier, E.
Guerra, J. Moron
Lampin, J. -F.
Ducournau, G.
Quere, Y.
ESSCIRC CONFERENCE 2015 - 41ST EUROPEAN SOLID-STATE CIRCUITS CONFERENCE (ESSCIRC), 2015, : 307 - 310

← 1 2 →