Aging monitoring method for IGBT module based on conduction voltage drop in bridge-arm short-circuit

被引：0
|
作者：
Liu, Shiyuan [1 ]
Zhang, Jingwei [2 ]
Zhao, Cui [1 ]
Liu, Kun [1 ]
He, Fangyuan [1 ]
机构：
[1] College of Applied Science and Technology, Beijing Union University, Beijing, China
[2] School of Electrical Engineering, China University of Ming and Technology, Xuzhou, China
来源：
IET Power Electronics | 2024年 / 17卷 / 16期
关键词：
D O I：
10.1049/pel2.12825
中图分类号：
学科分类号：
摘要：
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页码：2842 / 2851
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