Advancing stability in inverted polymer solar cells through accelerated xenon curing of the ZnO layer

被引:0
|
作者
Lee, Chih-Chien [1 ]
Ku, Pei-Chun [1 ]
Uma, Kasimayan [2 ]
Lin, Hui-Chieh [2 ]
Chung, Ssu-Yung [2 ]
Liu, Shun-Wei [2 ,3 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Elect Engn, Taipei 10607, Taiwan
[2] Ming Chi Univ Technol, Organ Elect Res Ctr, New Taipei City 24301, Taiwan
[3] Ming Chi Univ Technol, Dept Elect Engn, New Taipei City 24301, Taiwan
关键词
Solar cell; Electron transport layer; Thin film; Xenon annealing; Lattice oxygen; Stability; ELECTRON-TRANSPORT LAYER; THIN-FILM TRANSISTORS; INTENSE PULSED-LIGHT; OXIDE; PERFORMANCE; EFFICIENCY;
D O I
10.1016/j.orgel.2024.107146
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This study delves into the profound implications of employing an intensive xenon lamp treatment with a rapid curing method completed within 4 min, to fabricate a ZnO layer. Subsequently, we applied a coating of PM6:Y6 as the active layer and utilized MoO3/Ag as the contact electrode, aiming to advance the efficiency of polymer solar cells (PSCs) through entirely room-temperature processes. Our investigation juxtaposes this xenon lamp treatment with the conventional hot plate method for annealing the ZnO layer, conducted at 180 degrees C for both 20 min and 4 min. Remarkably, our proposed xenon lamp treatment process not only promotes charge transfer but also exhibits enhancements of the lattice oxygen in the Zn-O layer. This innovative methodology of xenon treatment yields a notable increase in power conversion efficiency (PCE), achieving 14.55 %, compared to 13.71 % and 12.44 % for the ZnO layers annealed with a hot plate for 20 min and 4 min, respectively. Moreover, devices subjected to the 4-min xenon lamp treatment maintained 85 % (T85) of their original Power Conversion Efficiency (PCE) after enduring 500 h of one-sun aging measurement. These findings evoke optimism regarding the xenon treatment's potential to streamline the fabrication process, and provide a promising avenue for mitigating interface degradation while enhancing the stability of PSCs.
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页数:9
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