共 50 条
- [1] A three-dimensional scanner for probe microscopy on the millimetre scale [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S861 - S866
- [2] A three-dimensional scanner for probe microscopy on the millimetre scale [J]. Applied Physics A, 1998, 66 : S861 - S866
- [3] A single crystal piezoelectric scanner for scanning probe microscopy [J]. OPTOMECHATRONIC SYSTEMS IV, 2003, 5264 : 186 - 193
- [4] Three-dimensional displacements of a piezoelectric tube scanner [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01): : 226 - 229
- [5] Optimal design and fabrication of three-dimensional calibration specimens for scanning probe microscopy [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2012, 83 (05):
- [6] A three-dimensional evaluation of a laser scanner and a touch-probe scanner [J]. JOURNAL OF PROSTHETIC DENTISTRY, 2006, 95 (03): : 194 - 200
- [7] Oil as an Enabler for Efficient Materials Removal in Three-Dimensional Scanning Probe Microscopy Applications [J]. FRONTIERS IN MECHANICAL ENGINEERING-SWITZERLAND, 2021, 7
- [8] Three-Dimensional Kelvin Probe Force Microscopy [J]. ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (28) : 32719 - 32728
- [9] A Verifying Method for Scanning Parameters of Three-Dimensional Laser Scanner [J]. 2011 INTERNATIONAL CONFERENCE ON COMPUTERS, COMMUNICATIONS, CONTROL AND AUTOMATION (CCCA 2011), VOL III, 2010, : 59 - 61
- [10] Three-dimensional Analysis of Nanomaterials by Scanning Probe Nanotomography [J]. 4TH INTERNATIONAL CONFERENCE OF PHOTONICS AND INFORMATION OPTICS, PHIO 2015, 2015, 73 : 173 - 176