Design of combinational self-testing devices with monotonically independent outputs

被引：0
|
作者：
Gessel', M. [1 ]
Morozov, A.A. [1 ]
Sapozhnikov, V.V. [1 ]
Sapozhnikov, Vl.V. [1 ]
机构：
[1] Peterburgskij Inst Inzhenerov, Zheleznodorozhnogo Transporta, St Petersburg, Russia
来源：
Avtomatika i Telemekhanika | 1994年 / 07期
关键词：
Algorithms - Combinatorial circuits - Control - Control theory - Design - Graph theory - Reliability - Schematic diagrams;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A method is suggested for designing the self-checking circuits of embedded control for combinational devices. The method develops the E.S. Sogomonyan's method based on using the independent outputs conception. The method provides detection of all single constant faults in working operation. It is shown that self-checking detectors of codes with error detection can be used as the embedded control circuits on the basis of analysis of structural and functional dependence between discrete devices outputs.
引用
收藏
页码：148 / 160
相关论文
共 50 条
  • [1] CONSTRUCTION OF COMBINATIONAL SELF-CHECKING DEVICES WITH MONOTONICALLY INDEPENDENT OUTPUTS
    GESSEL, M
    SAPOZHNIKOV, VV
    SAPOZHNIKOV, VV
    AUTOMATION AND REMOTE CONTROL, 1994, 55 (07) : 1050 - 1059
  • [2] DESIGN OF SELF-TESTING AND SELF-CHECKING COMBINATIONAL-CIRCUITS WITH WEAKLY INDEPENDENT OUTPUTS
    GOESSEL, M
    SOGOMONYAN, ES
    AUTOMATION AND REMOTE CONTROL, 1992, 53 (08) : 1264 - 1272
  • [3] Construction of Combination Self-Checking Devices with Monotonically Independent Outputs
    Gessel, M.
    Sapozhnikov, V. V.
    Sapozhnikov, V. V.
    Automation and Remote Control (English translation of Avtomatika i Telemekhanika), 1994, 55
  • [4] Study of combinational self-checking devices with independent and monotonic independent outputs
    Goessel, M
    Morozov, AA
    Sapozhnikov, VV
    Sapozhnikov, VV
    AUTOMATION AND REMOTE CONTROL, 1997, 58 (02) : 299 - 309
  • [5] Self-testing combinational circuits: Their design through the use of the properties of self-dual functions
    Gessel', M
    Morozov, AA
    Sapozhnikov, VV
    Sapozhnikov, VV
    AUTOMATION AND REMOTE CONTROL, 2000, 61 (02) : 318 - 329
  • [6] Formal verification of self-testing properties of combinational circuits
    Kawakubo, K
    Tanaka, K
    Hiraishi, H
    PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 119 - 122
  • [7] Self-checking combinational circuits with unidirectionally independent outputs
    Morosow, A
    Saposhnikov, VV
    Saposhnikov, VV
    Goessel, N
    VLSI DESIGN, 1998, 5 (04) : 333 - 345
  • [8] A Self-Testing Method for Combinational Circuits Using Polymorphic Gates
    Ardakani, Hassan Hatefi
    Mashayekhi, Morteza
    2009 1ST ASIA SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 2009, : 178 - 182
  • [9] Design method of a class of embedded combinational self-testing checkers for two-rail codes
    Piestrak, SJ
    IEEE TRANSACTIONS ON COMPUTERS, 2002, 51 (02) : 229 - 234
  • [10] A New Approach to the Design of Built-in Internal Memory Self-Testing Devices
    Ivanyuk, A. A.
    Yarmolik, V. N.
    AUTOMATIC CONTROL AND COMPUTER SCIENCES, 2008, 42 (04) : 169 - 174
12345