Soft X-ray microscope using an imaging detector

被引：0
|
作者：
Inoue, Soichi [1 ]
Ogawa, Yoji [1 ]
Ueda, Katsunobu [1 ]
Sumiya, Mitsuo [1 ]
Takigawa, Tadahiro [1 ]
Aoki, Sadao [1 ]
机构：
[1] Toshiba Corp, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1990年 / 29卷 / 01期
关键词：
X-ray Apparatus;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：176 / 178
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