Dielectric properties of (100) textured thick Pb(ZrxTi 1-x)O3 films with different Zr/Ti atom ratios

被引：0
|
作者：
Cheng, Jinrong [1 ]
Zhu, Wenyi [1 ]
Li, Nan [1 ]
Cross, L. Eric [1 ]
机构：
[1] Materials Research Laboratory, Pennsylvania State University, University Park, PA 16802, United States
来源：
Journal of Applied Physics | 2002年 / 91卷 / 09期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
16
引用
收藏
页码：5997 / 6001
相关论文
共 50 条
  • [1] Dielectric properties of (100) textured thick Pb(ZrxTi1-x)O3 films with different Zr/Ti atom ratios
    Cheng, JR
    Zhu, WY
    Li, N
    Cross, LE
    JOURNAL OF APPLIED PHYSICS, 2002, 91 (09) : 5997 - 6001
  • [2] Structural and dielectric properties of Pb(Zr,Ti)O3 heterolayered thick films
    Sung-Gap, Lee
    Young-Jae, Shim
    Jin, Kim Cheol
    Jun-Ki, Chung
    JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 449 (1-2) : 73 - 76
  • [3] Improved energy storage properties in Pb 0.82 La 0.12 (Zr x Ti 1-x )O 3 antiferroelectric films with different Zr/Ti ratios
    Wang, X. W.
    Hou, M. Z.
    Yang, F.
    Fu, Y. X.
    Li, X. F.
    Chen, J. Y.
    Yu, K. X.
    Shao, D. H.
    JOURNAL OF POWER SOURCES, 2025, 628
  • [4] Dielectric properties of a ferroelectric (1-x)Pb(Ti,Zr)O3-x Bi(Sr,Ti)O3 solid solution
    Alpatov, A. V.
    Burkhanov, A. I.
    Bormanis, K.
    Kalvane, A.
    TECHNICAL PHYSICS, 2012, 57 (05) : 716 - 719
  • [5] Piezoelectric and dielectric properties of sputter deposited (111), (100) and random-textured Pb(ZrxTi1-x)O3 (PZT) thin films
    Hiboux, S
    Muralt, P
    FERROELECTRICS, 1999, 224 (1-4) : 743 - 750
  • [6] Piezoelectric and dielectric properties of sputter deposited (111), (100) and random-textured Pb(ZrxTi1-x)O3 (PZT) thin films
    Lab. de Ceramique, Departement des Materiaux, EPFL, 1015 Lausanne, Switzerland
    Ferroelectrics, 1-4 (315-322):
  • [7] Insight into the Impact of Zr/Ti Ratios on the Structure and Properties of (Pb, La)(Zr, Sn, Ti)O3 Antiferroelectric Thick Films
    Liu, Yucheng
    Liu, Shaopeng
    Yang, Tongqing
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2021, 218 (06):
  • [8] Structures and Dielectric Properties of (Pb,La)(Zr,Ti)O3 Antiferroelectric Thick Films Prepared by different sintering procedures
    Geng, Wenping
    Chou, Xiujian
    Lv, Yongbo
    Xiong, Jijun
    Zhang, Wendong
    MICRO-NANO TECHNOLOGY XIII, 2012, 503 : 375 - 380
  • [9] Phase transition and electrical properties of highly [111]-oriented and niobium- modified Pb(ZrxTi1-x)O3 thin films with different Zr/Ti ratios
    Ruangchalermwong, C.
    Li, Jing-Feng
    Zhu, Zhi-Xiang
    Muensit, S.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (22)
  • [10] Ferroelectric properties of highly (111)-oriented Pb(Zr1-x, Tix)O3 thin films with different Zr/Ti ratios
    Zhang, S. Q.
    Fei, W. D.
    Li, W. L.
    Wang, J. N.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 487 (1-2) : 703 - 707
12345